Home > Product Index > InP Sub > InP Sub n type
GaAs Substrates
InP Substrates
GaN Substrates
Epitaxial Wafers
[ Download PDF version formatted for print : 727KB ]
（＊1） VCZ：Vapor Pressure Controlled Czochralski （＊2） EPD Guaranteed Area：Percentage of points within spec. （＊3） High Precision OF（±0.02°）is available for 2"φ. （＊4） EW：Etched Wafer （＊5） LPD：Light Point Defects
- Standard
Resistivity・Mobility・Diameter・OF・IF・Thickness （min.～max.） EPD Map
- Option
Accuracy of Orientation・Flatness・Light Point Defects
Semi-Insulating
n type
p type
Other specifications
: 727KB ]
