InP Sub n type
Standard Specifications
Notes
(*1) High Precision OF(±0.02°) is available.
(*2) EW : Etched Wafer
(*3) LPD : Light Point Defects
Attached Data
- Standard
- :
- Resistivity, Mobility, Diameter, OF, IF, Thickness(min.~max.), EPD Map
- Option
- :
- Accuracy of Orientation, Flatness, Light Point Defects