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Analysis Technology Research Center

The Analysis Technology Research Center supports the Sumitomo Electric Group’s manufacturing, product development, business development and technological foundation. The center is active at three sites, in Osaka, Itami and Yokohama, uses advanced large research facilities (SPring-8, K computer, etc.) outside the company, and boasts sophisticated analysis techniques and computer aided engineering (CAE).

Strategic CAE infrastructure development

The use of CAE is not simply intended to improve product development efficiency. We regard it as a key technology for attaining increased market competitiveness. Our efforts are directed toward infrastructure development to enhance the core CAE functionality of the Sumitomo Electric Group.

Strategic CAE infrastructure development

For widespread use of CAE for analytical purposes

We promote the development and widespread use of CAE analysis techniques that are useful for product designing. Our efforts include providing training to designers and developing simplified/automatic analysis systems. Thus, we work on the transfer of analysis techniques to design departments using procedures that precisely meet designers’ needs.

For widespread use of CAE for analytical purposes

Electric wire service life prediction

Mobile phone hinges, automotive doors and robot arms have electric wires and cables installed in their moving parts. We work on the development of a computer simulation technology for predicting the service life of such wires and cables until breakage due to twisting and bending.

Electric wire service life prediction

3D structure visualization

Three-dimensional structure visualization has been developed to observe the internal structures and targeted areas of composite materials, parts, products, as well as objects as they are.

This technology is useful for improving product quality and developing solutions to problems.

3D structure visualization

Elemental mapping with sub-micron resolution

We work on the development of a technology to visualize, with high spatial resolution, and the distribution of a low-concentration dopant that determines the characteristics of functional materials and parts, using an electron probe microanalyzer.

Elemental mapping with sub-micron resolution

Nanometer-level structural analysis

Our efforts are directed toward developing a nanometer-level structural analysis technology in order to establish an analytical technology and its applications, principally using scanning transmission electron microscopes and conducting crystal structure analyses.

Nanometer-level structural analysis

Analysis on the atomic scale using synchrotron radiation and first-principles calculation

We work on technological development such as structural analysis of materials at the atomic scale and in-situ reaction analysis, using synchrotron radiation and neutrons.

Moreover, our aims include elucidation of characteristic development mechanisms and exploration of new materials, in which the aforementioned technology is combined with first-principles calculation and other simulations.

Analysis on the atomic scale using synchrotron radiation and first-principles calculation

*IBM, IBM System x are either registered trademarks or trademarks of IBM Corporation in the United States, and/or other countries.

*Intel, Xeon are either registered trademarks or trademarks of Intel Corporation in the United States, and/or other countries.

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